DVI has full access to a wide variety of optical and electron microscopes to support an accident investigation. There are three well-known branches of microscopy, optical, electron, and scanning probe microscopy. Optical and electron microscopy involve the diffraction, reflection, or refraction of electromagnetic radiation/electron beams interacting with the specimen, and the subsequent collection of this scattered radiation or another signal in order to create an image. These methods can be valuable because the failed products are often unaffected by analysis, and the subject evidence can remain intact.
